The VALID SL in-circuit and functional test system is designed for high-channel-count testing in demanding electronics manufacturing environments. Introduces a cable-free architecture with new ...
Agilent Technologies has introduced the Medalist i3070 Series 5 in-circuit test (ICT) platform, marking 20 years since the company launched the first members of the 3070 ICT family. The Series 5 ICT ...
A version of Part 1 appeared in the Dec. 2011/Jan. 2012 issue of Test & Measurement World. See the PDF. In January 1979, Electronic Test published an article claiming that a single test circuit that ...
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