Scientists used Lorentz transmission electron microscopy (LTEM) to visualize topological defects. They were able to do so by passing electrons and observing their deflections through a thin magnetic ...

This paper reviews the research progress of layered double hydroxide (LDH) with various types of defects and its regulation strategies in recent years. Furthermore, the relationship between the ...

Scientists have identified a new type of defect as the most common source of disorder in on-surface synthesized graphene nanoribbons, a novel class of carbon-based materials that may prove extremely ...

Reducing defects on the wafer edge, bevel, and backside is becoming essential as the complexity of developing leading-edge chips continue to increase, and where a single flaw can have costly ...